Electron-Beam-Induced Current Study of Electronic Property...

Materials Science Forum 2012 / 7 Vol. 725

Electron-Beam-Induced Current Study of Electronic Property Change at SrTiO3 Bicrystal Interface Induced by Forming Process

Kato, Tetsuji, Nakamura, Yoshiaki, Son, P.P.T., Kikkawa, Jun, Sakai, Akira
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Volume:
725
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.725.261
Date:
July, 2012
File:
PDF, 780 KB
english, 2012
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