New Possibilities of X-Ray Diffraction Methods in Structure...

Materials Science Forum 1998 Vol. 278-281

New Possibilities of X-Ray Diffraction Methods in Structure Investigations of Multilayer Materials

Bonarski, Jan T., Świątek, Zbigniew, Ciach, R., Kuźnicki, Z.T., Fodchuk, I.M.
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Volume:
278-281
Year:
1998
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.278-281.164
File:
PDF, 668 KB
1998
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