Isolated Substitutional Silver and Silver-Induced Defects in Silicon: An Electron Paramagnetic Resonance Investigation
Hai, P.N., Gregorkiewicz, T., Ammerlaan, C.A.J., Don, D.T.Volume:
258-263
Year:
1997
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.258-263.491
File:
PDF, 477 KB
1997