Structure Parameter Determination of Thin Films by...

Structure Parameter Determination of Thin Films by Intensity Fitting in GIABD-Geometry

Klimke, J., Wulff, Harm
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Volume:
228-231
Year:
1996
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.228-231.295
File:
PDF, 397 KB
1996
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