Study of Crystallographic Orientation of in situ β-Si3N4...

Study of Crystallographic Orientation of in situ β-Si3N4 Composite by Electron Back Scattered Diffraction (EBSD) Method

Yasutomi, Yoshiyuki, Sakaida, Yoshihisa, Hirosaki, Naoto, Ikuhara, Yuichi
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Volume:
161-163
Year:
1999
Journal:
Key Engineering Materials
DOI:
10.4028/www.scientific.net/KEM.161-163.31
File:
PDF, 469 KB
1999
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