Study of Crystallographic Orientation of in situ β-Si3N4 Composite by Electron Back Scattered Diffraction (EBSD) Method
Yasutomi, Yoshiyuki, Sakaida, Yoshihisa, Hirosaki, Naoto, Ikuhara, YuichiVolume:
161-163
Year:
1999
Journal:
Key Engineering Materials
DOI:
10.4028/www.scientific.net/KEM.161-163.31
File:
PDF, 469 KB
1999