Investigation of Oxygen Contamination in Indium Nitride...

Advanced Materials Research 2010 / 1 Vol. 93-94

Investigation of Oxygen Contamination in Indium Nitride Thin Film by X-Ray Absorption Fine Structure

Amnuyswat, K., Thanomngam, Pitiporn, Sopitpan, Suwat, Sungthong, A., Porntheerapat, Supanit, Nukeaw, J.
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Volume:
93-94
Language:
english
Journal:
Advanced Materials Research
DOI:
10.4028/www.scientific.net/AMR.93-94.493
Date:
January, 2010
File:
PDF, 485 KB
english, 2010
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