Characterization of the Interface Ta/GaAs in Schottky Barrier Structures Prepared by Low Energy RF Sputtering with X-Ray Photoemission, TEM and Optical Transmittance Measurements
Gladkov, P., Varblianska, K., Marinova, Ts., Krastev, V., Stoemenos, J.Volume:
126-128
Year:
1993
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.126-128.463
File:
PDF, 322 KB
1993