Complex impedance spectroscopy of high-k HfO2thin films in...

Complex impedance spectroscopy of high-k HfO2thin films in Al/HfO2/Si capacitor for gate oxide applications

Nath, Madhuchhanda, Roy, Asim
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Volume:
26
Language:
english
Journal:
Journal of Materials Science: Materials in Electronics
DOI:
10.1007/s10854-015-2862-1
Date:
June, 2015
File:
PDF, 745 KB
english, 2015
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