The Mean Projected Range and Range Straggling of Nd Ions Implanted in Silicon Carbide
Qin, Xi Feng, Li, Shuang, Wang, Feng Xiang, Liang, YiVolume:
474-476
Language:
english
Journal:
Key Engineering Materials
DOI:
10.4028/www.scientific.net/KEM.474-476.565
Date:
April, 2011
File:
PDF, 314 KB
english, 2011