[IEEE 2014 9th International Design & Test Symposium (IDT) - Algeries, Algeria (2014.12.16-2014.12.18)] 2014 9th International Design and Test Symposium (IDT) - Reaction-diffusion model for interface traps induced by BTS stress including H+, H and H2 as diffusion species
Boubaaya, Mohamed, Tahi, Hakim, Djezzar, Boualem, Benmassai, Karim, Benabdelmoumene, Abdelmadjid, Goudjil, Mohamed, Doumaz, Djamila, Hemida, Abdelhak FerahtYear:
2014
Language:
english
DOI:
10.1109/idt.2014.7038619
File:
PDF, 299 KB
english, 2014