Performance, Reliability, and Robustness of 4H-SiC Power...

Materials Science Forum 2010 / 4 Vol. 645-648

Performance, Reliability, and Robustness of 4H-SiC Power DMOSFETs

Ryu, Sei Hyung, Hull, Brett A., Dhar, Sarit, Cheng, L., Zhang, Qing Chun, Richmond, Jim, Das, Mrinal K., Agarwal, Anant, Palmour, John, Lelis, Aivars J., Geil, Bruce, Scozzie, Charles
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Volume:
645-648
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.645-648.969
Date:
April, 2010
File:
PDF, 771 KB
english, 2010
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