Growth, Structural and Mechanical Characterization and...

Key Engineering Materials 2011 / 11 Vol. 495

Growth, Structural and Mechanical Characterization and Reliability of Chemical Vapor Deposited Co and Co3O4 Thin Films as Candidate Materials for Sensing Applications

Tsikourkitoudi, Vasiliki P., Koumoulos, Elias P., Papadopoulos, Nikolaos, Charitidis, Costas A.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
495
Language:
english
Journal:
Key Engineering Materials
DOI:
10.4028/www.scientific.net/KEM.495.108
Date:
November, 2011
File:
PDF, 448 KB
english, 2011
Conversion to is in progress
Conversion to is failed