CdTe surface roughness by Raman spectroscopy using the 830 nm wavelength
C. Frausto-Reyes, J. Rafael Molina-Contreras, C. Medina-Gutiérrez, Sergio CalixtoVolume:
65
Year:
2006
Language:
english
Pages:
5
DOI:
10.1016/j.saa.2005.07.082
File:
PDF, 306 KB
english, 2006