Positron Lifetime Measurements of Delta Doped MBE Grown...

Materials Science Forum 1995 Vol. 175-178

Positron Lifetime Measurements of Delta Doped MBE Grown Silicon Structures

Störmer, J., Willutzki, P., Britton, D.T., Triftshäuser, Werner, Kiunke, W., Hansch, W., Eisele, Ignaz
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Volume:
175-178
Year:
1995
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.175-178.213
File:
PDF, 309 KB
1995
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