The Detection of Different Physical Properties of Laser-Damaged HfO2 Film on SiO2 Substrate by Scanning Probe Acoustic Microscope
Yao, Wen Gang, Cheng, QianVolume:
194-196
Language:
english
Journal:
Advanced Materials Research
DOI:
10.4028/www.scientific.net/AMR.194-196.2448
Date:
February, 2011
File:
PDF, 686 KB
english, 2011