Dependence of the Surface Roughness and Localization Factor...

Materials Science Forum 2012 / 11 Vol. 729

Dependence of the Surface Roughness and Localization Factor Parameters on the Background Correction of AFM Images: A Thin Film Characterization Study

Bonyár, Attila, Molnár, Lászlo Milán, Harsányi, Gábor
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Volume:
729
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.729.193
Date:
November, 2012
File:
PDF, 918 KB
english, 2012
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