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Charge Trapping Memory Cell of TANOS (Oxide-SiN-Al2O3-TaN) Structure Erased by Fowler-Nordheim Tunneling of Holes
Lee, Chang-Hyun, Kang, Changseok, Shin, Yoocheol, Sim, Jaesung, Sel, Jongsun, Choe, Byeong-In, Choi, Jungdal, Kim, KinamVolume:
933
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/PROC-0933-G02-09
Date:
January, 2006
File:
PDF, 104 KB
english, 2006