Low-Leakage SRAM Wordline Drivers for the 28-nm UTBB FDSOI Technology
Corsonello, Pasquale, Frustaci, Fabio, Perri, StefaniaYear:
2015
Language:
english
Journal:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
DOI:
10.1109/tvlsi.2014.2384007
File:
PDF, 1.89 MB
english, 2015