[IEEE 2014 IEEE International Test Conference (ITC) - Seattle, WA, USA (2014.10.20-2014.10.23)] 2014 International Test Conference - Counterfeit IC detection using light emission
Song, Peilin, Stellari, Franco, Weger, AlanYear:
2014
Language:
english
DOI:
10.1109/test.2014.7035356
File:
PDF, 2.35 MB
english, 2014