In situ electrical characterization of tapered InAs nanowires in a transmission electron microscope with ohmic contacts
Zhang, Chao, Neklyudova, Mariya, Fang, Liang, Xu, Qiang, Wang, Hui, Tichelaar, Frans D, Zandbergen, Henny WVolume:
26
Language:
english
Journal:
Nanotechnology
DOI:
10.1088/0957-4484/26/15/155703
Date:
April, 2015
File:
PDF, 1.90 MB
english, 2015