X-Ray Imaging and TEM Study of Micropipes Related to their...

Materials Science Forum 2004 Vol. 457-460

X-Ray Imaging and TEM Study of Micropipes Related to their Propagation through Porous SiC Layer/SiC Epilayer Interface

Argunova, T.S., Gutkin, Mikhail Yu., Je, Jung Ho, Sorokin, L.M., Mosina, G.N., Savkina, N.S., Shuman, V.B., Lebedev, A.A.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
457-460
Year:
2004
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.457-460.363
File:
PDF, 328 KB
english, 2004
Conversion to is in progress
Conversion to is failed