Application of direct solid analysis of plant samples by...

Application of direct solid analysis of plant samples by electrothermal vaporization-inductively coupled plasma atomic emission spectrometry: Determination of Cd and Si for environmental purposes

Pierre Masson, Maxime Dauthieu, Fabienne Trolard, Laurence Denaix
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Volume:
62
Year:
2007
Language:
english
Pages:
7
DOI:
10.1016/j.sab.2007.01.004
File:
PDF, 184 KB
english, 2007
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