Parameter study of self-absorption effects in Total Reflection X-ray Fluorescence–X-ray Absorption Near Edge Structure analysis of arsenic
F. Meirer, G. Pepponi, C. Streli, P. Wobrauschek, P. Kregsamer, N. Zoeger, G. FalkenbergVolume:
63
Year:
2008
Language:
english
Pages:
7
DOI:
10.1016/j.sab.2008.05.004
File:
PDF, 620 KB
english, 2008