Thin film characterization by total reflection x-ray fluorescence
Adrien Danel, Emmanuel Nolot, Marc Veillerot, Ségolène Olivier, Tifenn Decorps, Maria-Luisa Calvo-Muñoz, Jean-Michel Hartmann, Sandrine Lhostis, Hiroshi Kohno, Motoyuki Yamagami, Charles GeoffroyVolume:
63
Year:
2008
Language:
english
Pages:
5
DOI:
10.1016/j.sab.2008.10.024
File:
PDF, 585 KB
english, 2008