Mapping Interfacial Roughness and Composition in Elemental...

Solid State Phenomena 1993 Vol. 32-33

Mapping Interfacial Roughness and Composition in Elemental Semiconductor Systems

Ourmazd, A., Schwander, P., Kisielowski-Kemmerich, Christian, Seibt, Michael, Baumann, F.H., Kim, Y.O.
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Volume:
32-33
Year:
1993
Journal:
Solid State Phenomena
DOI:
10.4028/www.scientific.net/SSP.32-33.615
File:
PDF, 165 KB
1993
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