Kelvin Probe Force Microscope Measurement Uncertainty
Ligowski, Maciej, Tabe, Michiharu, Jabłoński, RyszardVolume:
222
Language:
english
Journal:
Advanced Materials Research
DOI:
10.4028/www.scientific.net/AMR.222.114
Date:
April, 2011
File:
PDF, 1.14 MB
english, 2011