Low Temperature Deposition of HfO2 Gate Insulator on SiC by Metalorganic Chemical Vapor Deposition
Hino, Shiro, Hatayama, Tomohiro, Miura, Naruhisa, Ozeki, Tatsuo, Tokumitsu, EisukeVolume:
527-529
Year:
2006
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.527-529.1079
File:
PDF, 206 KB
english, 2006