Effect of Microstructure on Dielectric Properties of Si3N4 at Microwave Frequency
Park, Min Kyu, Kim, Ha Neul, Lee, Kee Sung, Baek, Seung Su, Kang, Eul Son, Baek, Yong Kee, Kim, Do KyungVolume:
287
Year:
2005
Language:
english
Journal:
Key Engineering Materials
DOI:
10.4028/www.scientific.net/KEM.287.247
File:
PDF, 2.99 MB
english, 2005