[IEEE 2005 IEEE International Conference on Mechatronics and Automation - Niagara Falls, Ont., Canada (29 July-1 Aug. 2005)] IEEE International Conference Mechatronics and Automation, 2005 - Research of gyro case rotation monitor technique based on random drift characteristics of gyro
Huang Wei-quan,, Cheng Jian-hua,, Yu Qiang,, Wu Lei,Volume:
2
Year:
2005
Language:
english
DOI:
10.1109/ICMA.2005.1626664
File:
PDF, 229 KB
english, 2005