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X-Ray Investigation on Strength of Thin Films
Hanabusa, Takao, Shinohara, MitsuhikoVolume:
638-642
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.638-642.2395
Date:
January, 2010
File:
PDF, 494 KB
english, 2010