Measurement of Optical Absorption in Very Thin Low-Loss...

MRS Proceedings 1987 / 1 Vol. 105

Measurement of Optical Absorption in Very Thin Low-Loss SiO2 Films

Curran, Robert M., Crook, Thomas M., Zook, J. David
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Volume:
105
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-105-175
Date:
January, 1987
File:
PDF, 303 KB
english, 1987
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