Structural Characterization of Cu Metallic Clusters in Amorphous SiO2 by Synchrotron Radiation Grazing Incidence X-Ray Scattering and Diffraction
D'Acapito, F., Thiaudière, D., Zontone, F., Regnard, J.R.Volume:
278-281
Year:
1998
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.278-281.891
File:
PDF, 580 KB
1998