MicroRaman and Hall Effect Study of n-Type Bulk 4H-SiC

Materials Science Forum 2000 Vol. 338-342

MicroRaman and Hall Effect Study of n-Type Bulk 4H-SiC

Chafai, M., Jiménez, J., Martín, Enric, Mitchel, W.C., Saxler, Adam W., Perrin, Ronald
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Volume:
338-342
Year:
2000
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.338-342.707
File:
PDF, 297 KB
2000
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