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Thermal Characterisation of AlGaN/GaN HEMTs using Micro-Raman Scattering Spectroscopy and Pulsed I-V Measurements
Aubry, R., Jacquet, J.-C., Dua, Christian, Gérard, H., Dessertenne, B., di Forte-Poisson, M.A., Cordier, Yvon, Delage, S.L.Volume:
457-460
Year:
2004
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.457-460.1625
File:
PDF, 265 KB
english, 2004