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Synchrotron X-ray Topography Studies of the Evolution of the Defect Microstructure in Physical Vapor Transport Grown 4H-SiC Single Crystals
Dudley, M., Raghothamachar, B., Wang, H., Wu, F., Byrappa, S., Chung, G., Sanchez, E. K., Mueller, S., Hansen, D., Loboda, M.Volume:
58
Language:
english
Journal:
ECS Transactions
DOI:
10.1149/05804.0315ecst
Date:
August, 2013
File:
PDF, 7.44 MB
english, 2013