A Comparison between SiO2/4H-SiC Interface Traps on (0001)...

Materials Science Forum 2004 Vol. 457-460

A Comparison between SiO2/4H-SiC Interface Traps on (0001) and (11-20) Faces

Ólafsson, H.Ö., Hallin, Christer, Sveinbjörnsson, Einar Ö.
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Volume:
457-460
Year:
2004
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.457-460.1305
File:
PDF, 363 KB
english, 2004
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