Microstructure dependence of leakage and resistive...

Journal of Physics D Applied Physics 2011 / 10 Vol. 44; Iss. 41

Microstructure dependence of leakage and resistive switching behaviours in Ce-doped BiFeO 3 thin films

Zhu, Xiaojian, Zhuge, Fei, Li, Mi, Yin, Kuibo, Liu, Yiwei, Zuo, Zhenghu, Chen, Bin, Li, Run-Wei
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Volume:
44
Language:
english
Journal:
Journal of Physics D: Applied Physics
DOI:
10.1088/0022-3727/44/41/415104
Date:
October, 2011
File:
PDF, 744 KB
english, 2011
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