Robust test generation for transistor stuck-open faults in CMOS complex gates
TSIATOUHAS, Y., PASCHALIS, A., NIKOLOS, D., HALATSIS, C.Volume:
79
Language:
english
Journal:
International Journal of Electronics
DOI:
10.1080/00207219508926255
Date:
August, 1995
File:
PDF, 259 KB
english, 1995