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[ECS ISTC/CSTIC 2009 (CISTC) - Shanghai, China (March 19 - March 20, 2009)] ECS Transactions - A Study of Stress Technology for 65nm Generic CMOS Technology
Liu, Xinfu, Dai, Wenjun, Yu, Xing, Lim, Louis, Xue, Bin, He, BoyongYear:
2009
Language:
english
DOI:
10.1149/1.3096429
File:
PDF, 394 KB
english, 2009