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In situ High-Resolution Transmission Electron Microscopy of Interfaces in Phase Transformations
Howe, J.M., Moore, K.T., Csontos, A.A., Benson, W.E., Tsai, M.M.Volume:
294-296
Year:
1999
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.294-296.43
File:
PDF, 885 KB
1999