S-Band Polarimetric Radar Scattering Measurement from Different Random Rough Surface
Jia, Ming Quan, Tong, Ling, Chen, Yan, Lu, Hai PingVolume:
500
Language:
english
Journal:
Key Engineering Materials
DOI:
10.4028/www.scientific.net/KEM.500.416
Date:
January, 2012
File:
PDF, 383 KB
english, 2012