Transient capacitance measurement of MEM capacitor
Heikki Nieminen, Jari Hyyryläinen, Timo Veijola, Tapani Ryhänen, Vladimir ErmolovVolume:
117
Year:
2005
Language:
english
Pages:
6
DOI:
10.1016/j.sna.2004.06.023
File:
PDF, 212 KB
english, 2005