![](/img/cover-not-exists.png)
Influence of polycrystalline silicon as electrical shield on reliability and stability of piezoresistive sensors
Phan L.P. Hoa, G. Suchaneck, G. GerlachVolume:
120
Year:
2005
Language:
english
Pages:
6
DOI:
10.1016/j.sna.2004.12.029
File:
PDF, 306 KB
english, 2005