Application of Synchrotron Radiation to Residual Stress Analysis by IP/cosα Method
Sasaki, Toshihiko, Miyazawa, Yohei, Takahashi, Shunichi, Matsuyama, Ryohei, Sasaki, Katsunari, Hiratsuka, KoichiVolume:
571-572
Year:
2008
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.571-572.249
File:
PDF, 436 KB
english, 2008