Local Strain Calculations Using Electron Backscattered Diffraction (EBSD) Measurements and Digital Image Processing
Mukherjee, S., Mishra, Sushil K., Samajdar, Indradev, Pant, PritaVolume:
702-703
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.702-703.562
Date:
December, 2011
File:
PDF, 336 KB
english, 2011