Microscopic Degradation Analysis of RF-Stressed AlGaN/GaN HEMTs
Gütle, Frank, Baeumler, Martina, Dammann, Michael, Cäsar, Markus, Walcher, Herbert, Waltereit, Patrick, Bronner, Wolfgang, Müller, Stefan, Kiefer, Rudolf, Quay, Rüdiger, Mikulla, Michael, Ambacher, OlVolume:
725
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.725.79
Date:
July, 2012
File:
PDF, 1.09 MB
english, 2012