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Electric Loading-Induced Cracking Behavior at Electrode Edges in PZT Ceramics
Kusukawa, Kazuhiro, Shiozaki, YoheiVolume:
352
Year:
2007
Language:
english
Journal:
Key Engineering Materials
DOI:
10.4028/www.scientific.net/KEM.352.267
File:
PDF, 809 KB
english, 2007