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Sensor testing through bias superposition
C. Jeffrey, N. Dumas, Z. Xu, F. Mailly, F. Azaïs, P. Nouet, R.J.T. Bunyan, D.O. King, H. Mathias, J.P. Gilles, A.M.D. RichardsonVolume:
136
Year:
2007
Language:
english
Pages:
15
DOI:
10.1016/j.sna.2006.11.030
File:
PDF, 2.35 MB
english, 2007