Novel Test Procedure of Tensile Test for MEMS Materials
Park, Jun Hyub, Kim, Yun Jae, Myung, Man Sik, Lee, Chang Seung, Choa, Sung Hoon, Choi, Nam SupVolume:
321-323
Year:
2006
Language:
english
Journal:
Key Engineering Materials
DOI:
10.4028/www.scientific.net/KEM.321-323.136
File:
PDF, 435 KB
english, 2006