Comparative Study of Electrical and Microstructural...

Materials Science Forum 2012 / 5 Vol. 717-720

Comparative Study of Electrical and Microstructural Properties of 4H-SiC MOSFETs

Strenger, Christian, Häublein, Volker, Erlbacher, Tobias, Bauer, Anton J., Ryssel, Heiner, Beltran, Ana Maria, Schamm-Chardon, Sylvie, Mortet, Vincent, Bedel-Pereira, Eléna, Lefebvre, Mathieu, Cristia
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Volume:
717-720
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.717-720.437
Date:
May, 2012
File:
PDF, 942 KB
english, 2012
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